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[IEEE International Conference on Microelectronic Test Structures - Goteborg, Sweden (15-18 March 1999)] ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) - A new extraction method for BSIM3v3 model parameters of RF silicon MOSFETs

✍ Scribed by Seonghearn Lee, ; Hyun Kyu Yu,

Book ID: 120829035
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 333 KB
Category: Article
ISBN-13: 9780780352704
DOI: 10.1109/ICMTS.1999.766223

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