✦ LIBER ✦

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Software reliability accelerated testing method based on test coverage

✍ Scribed by Wang, Shuanqi; Wu, Yumei; Lu, Minyan; Li, Haifeng

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Integrity (RAMS) - Lake Buena Vist

✍ Bluvband, Zigmund; Porotsky, Sergey; Talmor, Michael 📂 Article 📅 2011 🏛 IEEE ⚖ 386 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

✍ Luo, Wei; Zhang, Chun-hua; Tan, Yuan-yuan; Chen, Xun 📂 Article 📅 2011 🏛 IEEE ⚖ 361 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

✍ Snooke, Neal; Price, Chris 📂 Article 📅 2011 🏛 IEEE ⚖ 729 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

✍ Dwyer, Dave; D'Onofrio, Paul 📂 Article 📅 2011 🏛 IEEE ⚖ 459 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

✍ Guo, Huairui; Liao, Haitao; Gerokostopoulos, Athanasios; Mettas, Adamantios 📂 Article 📅 2011 🏛 IEEE ⚖ 415 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

✍ Qin, Jin; Avshalom, Hava; Bernstein, Joseph B. 📂 Article 📅 2011 🏛 IEEE ⚖ 473 KB