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[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Improvements in estimating software reliability from growth test data

✍ Scribed by Dwyer, Dave; D'Onofrio, Paul

Book ID: 126693066
Publisher: IEEE
Year: 2011
Weight: 459 KB
Category: Article
ISBN: 1424488575
DOI: 10.1109/RAMS.2011.5754434

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