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[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Design of reliability demonstration testing for repairable systems

✍ Scribed by Guo, Huairui; Liao, Haitao; Gerokostopoulos, Athanasios; Mettas, Adamantios

Book ID: 117991715
Publisher: IEEE
Year: 2011
Weight: 415 KB
Volume: 0
Category: Article
ISBN: 1424488575
DOI: 10.1109/rams.2011.5754441

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