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[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - System reliability assessment as components undergo accelerated testing

✍ Scribed by Luo, Wei; Zhang, Chun-hua; Tan, Yuan-yuan; Chen, Xun

Book ID: 126729924
Publisher: IEEE
Year: 2011
Weight: 361 KB
Category: Article
ISBN: 1424488575
DOI: 10.1109/RAMS.2011.5754478

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