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[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - FaRBS: A new PoF based VLSI reliability prediction method

✍ Scribed by Qin, Jin; Avshalom, Hava; Bernstein, Joseph B.

No coin nor oath required. For personal study only.

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