𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE IEEE Radiation Effects Data Workshop, 2005. - Seattle, WA, USA (11-15 July 2005)] IEEE Radiation Effects Data Workshop, 2005. - Single event upset characterization of the SMJ320C6701 digital signal processor using proton irradiation

✍ Scribed by Hiemstra, D.M.; Miladinovic, B.; Chayab, F.

Book ID: 126732260
Publisher: IEEE
Year: 2005
Weight: 224 KB
Category: Article
ISBN-13: 9780780393677
DOI: 10.1109/REDW.2005.1532663

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE IEEE Radiation Effects Data Worksh

[IEEE IEEE Radiation Effects Data Workshop, 2005. - Seattle, WA, USA (11-15 July 2005)] IEEE Radiation Effects Data Workshop, 2005. - SEE and TID results for a commercially fabricated radiation-hardened clock generator circuit

✍ Hafer, C.; Schnathorst, V.; Pfeil, J.; Meade, T.; Farris, T.; Jordan, A. 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 549 KB

[IEEE IEEE Radiation Effects Data Worksh

[IEEE IEEE Radiation Effects Data Workshop, 2005. - Seattle, WA, USA (11-15 July 2005)] IEEE Radiation Effects Data Workshop, 2005. - Recent total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA

✍ Cochran, D.J.; Kniffin, S.D.; Ladbury, R.L.; O'Bryan, M.V.; Poivey, C.F.; Kim, H 📂 Article 📅 2005 🏛 IEEE ⚖ 847 KB

[IEEE 2009 IEEE Radiation Effects Data W

[IEEE 2009 IEEE Radiation Effects Data Workshop (in Conjunction with NSREC 2009) - Quebec, Canada (2009.07.20-2009.07.24)] 2009 IEEE Radiation Effects Data Workshop - Single Event Upset Characterization of the TMS320C6713 Digital Signal Processor Using Proton Irradiation

✍ Hiemstra, David M. 📂 Article 📅 2009 🏛 IEEE ⚖ 612 KB

[IEEE 2010 Radiation Effects Data Worksh

[IEEE 2010 Radiation Effects Data Workshop - denver, CA, USA (2010.07.20-2010.07.23)] 2010 IEEE Radiation Effects Data Workshop - Single Event Upset Characterization of the Virtex-5 Field Programmable Gate Array Using Proton Irradiation

✍ Hiemstra, David M.; Battiston, George; Gill, Prab 📂 Article 📅 2010 🏛 IEEE ⚖ 245 KB

[IEEE 2011 IEEE Radiation Effects Data W

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Single Event Upset Characterization of a Mixed-Signal Field Programmable Gate Array Using Proton Irradiation

✍ Hiemstra, David M.; Gill, Prab 📂 Article 📅 2011 🏛 IEEE ⚖ 289 KB

[IEEE 2012 IEEE Radiation Effects Data W

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Single Event Upset Characterization of the Virtex-6 Field Programmable Gate Array Using Proton Irradiation

✍ Hiemstra, David M.; Kirischian, Valeri 📂 Article 📅 2012 🏛 IEEE ⚖ 253 KB