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[IEEE IEEE Radiation Effects Data Workshop, 2005. - Seattle, WA, USA (11-15 July 2005)] IEEE Radiation Effects Data Workshop, 2005. - SEE and TID results for a commercially fabricated radiation-hardened clock generator circuit

✍ Scribed by Hafer, C.; Schnathorst, V.; Pfeil, J.; Meade, T.; Farris, T.; Jordan, A.

Book ID: 125987140
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 549 KB
Category: Article
ISBN-13: 9780780393677
DOI: 10.1109/REDW.2005.1532672

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