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[IEEE 2004 IEEE Radiation Effects Data Workshop - Atlanta, GA, USA (22 July 2004)] 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) - SEE and TID results for a commercially fabricated radiation hardened field programmable gate array

✍ Scribed by Hafer, C.; Lake, R.; Jordan, A.; Farris, T.

No coin nor oath required. For personal study only.

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