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[IEEE 2010 Radiation Effects Data Workshop - denver, CA, USA (2010.07.20-2010.07.23)] 2010 IEEE Radiation Effects Data Workshop - Single Event Upset Characterization of the Virtex-5 Field Programmable Gate Array Using Proton Irradiation

✍ Scribed by Hiemstra, David M.; Battiston, George; Gill, Prab

No coin nor oath required. For personal study only.

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