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[IEEE 2010 Radiation Effects Data Workshop - denver, CA, USA (2010.07.20-2010.07.23)] 2010 IEEE Radiation Effects Data Workshop - Radiation Test of 8 Bit Microcontrollers ATmega128 & AT90CAN128

✍ Scribed by Schuttauf, A.; Rakers, S.; Daniel, C.

Book ID: 118187991
Publisher: IEEE
Year: 2010
Weight: 376 KB
Volume: 0
Category: Article
ISBN: 1424484057
DOI: 10.1109/redw.2010.5619504

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