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[IEEE 2010 Radiation Effects Data Workshop - denver, CA, USA (2010.07.20-2010.07.23)] 2010 IEEE Radiation Effects Data Workshop - Radiation Performance of Commercial SiGe HBT BiCMOS High Speed Operational Amplifiers

✍ Scribed by Chen, Dakai; Pellish, Jonathan; Phan, Anthony; Kim, Hak; Burns, Sam; Albarian, Rafi; Holcombe, Bruce; Little, Bradley; Salzman, James; Marshall, Paul; LaBel, Kenneth

Book ID: 120034492
Publisher: IEEE
Year: 2010
Weight: 664 KB
Category: Article
ISBN: 1424484057
DOI: 10.1109/REDW.2010.5619511

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