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[IEEE 2010 Radiation Effects Data Workshop - denver, CA, USA (2010.07.20-2010.07.23)] 2010 IEEE Radiation Effects Data Workshop - SEU Testing of SiGe Bipolar and BiCMOS Circuits

✍ Scribed by Hansen, David L.; Le, Anthony; Chesnut, Kay; Miller, Eric; Pong, Steven; Sung, Sichul; Truong, John

Book ID: 120084665
Publisher: IEEE
Year: 2010
Weight: 312 KB
Category: Article
ISBN: 1424484057
DOI: 10.1109/REDW.2010.5619701

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