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[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Single Event Upset Characterization of a Mixed-Signal Field Programmable Gate Array Using Proton Irradiation

✍ Scribed by Hiemstra, David M.; Gill, Prab

Book ID: 120820619
Publisher: IEEE
Year: 2011
Weight: 289 KB
Category: Article
ISBN: 1457712814
DOI: 10.1109/REDW.2010.6062509

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