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[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Proton-Induced Single Event Upsets in 90nm Technology High Performance SRAM Memories

✍ Scribed by Puchner, H.; Tausch, J.; Koga, R.

Book ID: 120821364
Publisher: IEEE
Year: 2011
Weight: 270 KB
Category: Article
ISBN: 1457712814
DOI: 10.1109/REDW.2010.6062523

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