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[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - A Summary of Single Event Upset Testing of CD4000 Series Devices

✍ Scribed by Lombardi, Robert E.; Bogorad, Alexander L.; Likar, Justin J.; Rubin, Aaron S.; Camacho, Carlos F.

No coin nor oath required. For personal study only.

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