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[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Total Dose Test Results for CubeSat Electronics

✍ Scribed by Avery, Keith; Finchel, Jeffery; Mee, Jesse; Kemp, William; Netzer, Richard; Elkins, Donald; Zufelt, Brian; Alexander, David

Book ID: 120820616
Publisher: IEEE
Year: 2011
Weight: 736 KB
Category: Article
ISBN: 1457712814
DOI: 10.1109/REDW.2010.6062504

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