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[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Radiation Characterization of Commercial GaN Devices

✍ Scribed by Harris, Richard D.; Scheick, Leif Z.; Hoffman, James P.; Thrivikraman, Tushar; Jenabi, Masud; Gim, Yonggyu; Miyahira, Tetsuo

Book ID: 120821366
Publisher: IEEE
Year: 2011
Weight: 668 KB
Category: Article
ISBN: 1457712814
DOI: 10.1109/REDW.2010.6062526

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