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[IEEE 2009 IEEE Radiation Effects Data Workshop (in Conjunction with NSREC 2009) - Quebec, Canada (2009.07.20-2009.07.24)] 2009 IEEE Radiation Effects Data Workshop - Single Event Upset Characterization of the TMS320C6713 Digital Signal Processor Using Proton Irradiation

✍ Scribed by Hiemstra, David M.

Book ID: 126620445
Publisher: IEEE
Year: 2009
Weight: 612 KB
Category: Article
ISBN: 1424450926
DOI: 10.1109/REDW.2009.5336300

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