✦ LIBER ✦

[IEEE IEEE Lester Eastmann Biennial Conference - Newark, DE, USA (6-8 Aug. 2002)] Proceedings. IEEE Lester Eastman Conference on High Performance Devices - Characterization and analysis of gate and drain low-frequency noise in AlGaN/GaN HEMTs

✍ Scribed by Hsu, S.S.H.; Valizadeh, P.; Pavlidis, D.; Moon, J.S.; Micovic, M.; Wong, D.; Hussain, T.

No coin nor oath required. For personal study only.

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