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[IEEE IEEE Lester Eastmann Biennial Conference - Newark, DE, USA (6-8 Aug. 2002)] Proceedings. IEEE Lester Eastman Conference on High Performance Devices - Dynamic loadline analysis of AlGaN/GaN HEMTs

โœ Scribed by Green, B.M.; Kaper, V.S.; Tilak, V.; Shealy, J.R.; Eastman, L.F.


Book ID
118228481
Publisher
IEEE
Year
2002
Weight
624 KB
Volume
0
Category
Article
ISBN-13
9780780374782

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