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[IEEE IEEE Lester Eastmann Biennial Conference - Newark, DE, USA (6-8 Aug. 2002)] Proceedings. IEEE Lester Eastman Conference on High Performance Devices - Impact ionization in high performance AlGaN/GaN HEMTs

โœ Scribed by Brar, B.; Boutros, K.; DeWarnes, R.E.; Tilak, V.; Shealy, R.; Eastman, L.


Book ID
118122306
Publisher
IEEE
Year
2002
Weight
297 KB
Volume
0
Category
Article
ISBN-13
9780780374782

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