✦ LIBER ✦

[IEEE IEEE Lester Eastmann Biennial Conference - Newark, DE, USA (6-8 Aug. 2002)] Proceedings. IEEE Lester Eastman Conference on High Performance Devices - Digital etching for highly reproducible low damage gate recessing on AlGaN/GaN HEMTs

✍ Scribed by Buttari, D.; Heikman, S.; Keller, S.; Mishra, U.K.

No coin nor oath required. For personal study only.

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