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[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Device and circuit-level analog performance trade-offs: a comparative study of planar bulk FETs versus FinFETs

✍ Scribed by Subramaniana, V.; Parvais, B.; Borremans, J.; Mercha, A.; Linten, D.; Wambacq, P.; Loo, J.; Dehan, M.; Collaert, N.; Kubicek, S.; Lander, R.J.P.; Hooker, J.C.; Cubaynes, F.N.; Donnay, S.; Jurczak, M.; Groeseneken, G.; Sansen, W.; Decoutere, S.

Book ID: 120589191
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 383 KB
Category: Article
ISBN-13: 9780780392687
DOI: 10.1109/IEDM.2005.1609503

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