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[IEEE IEEE International Interconnect Technology Conference - Burlingame, CA, USA (2-4 June 2003)] Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695) - Chip-on-chip technology with copper through-plug for 0.15 μm SRAM

✍ Scribed by Matsuo, M.; Kasai, K.; Okayama, Y.; Ishimaru, K.; Matsunaga, N.; Yamaguchi, H.; Otsuka, N.; Hayasaka, N.

Book ID: 126678302
Publisher: IEEE
Year: 2003
Weight: 220 KB
Category: Article
ISBN-13: 9780780377974
DOI: 10.1109/IITC.2003.1219746

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