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[IEEE IEEE International Interconnect Technology Conference - Burlingame, CA, USA (2-4 June 2003)] Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695) - Analysis of resistivity in nano-interconnect: full range (4.2-300 K) temperature characterization

✍ Scribed by Guillaumond, J.F.; Arnaud, L.; Mourier, T.; Fayolle, M.; Pesci, O.; Reimbold, G.

Book ID: 126635455
Publisher: IEEE
Year: 2003
Weight: 174 KB
Category: Article
ISBN-13: 9780780377974
DOI: 10.1109/IITC.2003.1219733

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