[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Neutron soft error rate measurements in a 90-nm CMOS process and scaling trends in SRAM from 0.25-μm to 90-nm generation

✍ Scribed by Hazucha, P.; Karnik, T.; Maiz, J.; Walstra, S.; Bloechel, B.; Tschanz, J.; Dermer, G.; Hareland, S.; Armstrong, P.; Borkar, S.

• Book ID: 126627446
• Publisher: IEEE
• Year: 2003
• Weight: 270 KB
• Edition: 1
• Category: Article
• ISBN-13: 9780780378728
• DOI: 10.1109/IEDM.2003.1269336