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[IEEE IEEE International Conference on Microelectronic Test Structures - Long Beach, CA (February 22-23, 1988)] Proceedings of the IEEE International Conference on Microelectronic Test Structures - A Novel Device Structure For Studying Gate And Channel Edge Effects In IGFET's

✍ Scribed by Serack, J.A.; Walton, A.J.; Robertson, J.M.

Book ID: 126653846
Publisher: IEEE
Year: 1988
Weight: 469 KB
Category: Article
DOI: 10.1109/ICMTS.1988.672931

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