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[IEEE IEEE International Conference on Microelectronic Test Structures - Long Beach, CA (February 22-23, 1988)] Proceedings of the IEEE International Conference on Microelectronic Test Structures - Ring Oscillator Structure For realistic Dynamic Stress Of MOSFETS And Interconnects

✍ Scribed by Winnerl, J.; Neppl, F.; Lill, A.; Roska, G.; Zatisch, W.

Book ID: 126649420
Publisher: IEEE
Year: 1988
Weight: 419 KB
Category: Article
DOI: 10.1109/ICMTS.1988.672929

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