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[IEEE IEEE International Conference on Microelectronic Test Structures - Long Beach, CA (February 22-23, 1988)] Proceedings of the IEEE International Conference on Microelectronic Test Structures - Guidelines For Latch-up Characterization Techniques

✍ Scribed by Reczek, W.; Pribyl, W.

Book ID: 126630299
Publisher: IEEE
Year: 1988
Weight: 665 KB
Category: Article
DOI: 10.1109/ICMTS.1988.672946

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