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[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Implant damage and gate-oxide-edge effects on product reliability

✍ Scribed by Yung-Huei Lee, ; Nachman, R.; Hu, S.; Mielke, N.; Liu, J.

Book ID: 126608110
Publisher: IEEE
Year: 2004
Weight: 295 KB
Category: Article
ISBN-13: 9780780386846
DOI: 10.1109/IEDM.2004.1419194

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