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[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Performance analysis and design optimization of near ballistic carbon nanotube field-effect transistors

✍ Scribed by Jing Guo, ; Javey, A.; Hongjie Dai, ; Lundstrom, M.

Book ID: 120268296
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 280 KB
Category: Article
ISBN-13: 9780780386846
DOI: 10.1109/IEDM.2004.1419266

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