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[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - Mismatch characterisation of chip interconnect resistance

✍ Scribed by Deveugele, J.; Libin Yao, ; Steyaert, M.; Sansen, W.

Book ID: 126735106
Publisher: IEEE
Year: 2005
Weight: 718 KB
Category: Article
ISBN-13: 9780780388550
DOI: 10.1109/ICMTS.2005.1452259

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