𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - An improved LDMOS transistor model that accurately predicts capacitance for all bias conditions

✍ Scribed by Frere, S.F.; Moens, P.; Desoete, B.; Wojciechowski D, ; Walton, A.J.

Book ID: 125525781
Publisher: IEEE
Year: 2005
Weight: 809 KB
Category: Article
ISBN-13: 9780780388550
DOI: 10.1109/ICMTS.2005.1452226

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE ICMTS 2005. 2005 International Con

[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - Mismatch characterisation of chip interconnect resistance

✍ Deveugele, J.; Libin Yao, ; Steyaert, M.; Sansen, W. 📂 Article 📅 2005 🏛 IEEE ⚖ 718 KB

[IEEE ICMTS 2005. 2005 International Con

[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - Substrate isolation in 0.18um CMOS technology

✍ Rezvani, G.A.; Jon Tao, 📂 Article 📅 2005 🏛 IEEE ⚖ 927 KB

[IEEE ICMTS 2005. 2005 International Con

[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - Test structure for performance evaluation of 3 dimensional FinFETs

✍ Young Joon Ahn, ; Hye Jin Cho, ; Hee Soo Kang, ; Choong-Ho Lee, ; Chul Lee, ; Ja 📂 Article 📅 2005 🏛 IEEE ⚖ 540 KB

[IEEE ICMTS 2005. 2005 International Con

[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - 90nm CMOS technology characterization at transfer and ramp

✍ Kelleher, A.; Gourley, D.; Holmes, A.M.; Hepburn, T.; Farrell, C.; Groves, R.; T 📂 Article 📅 2005 🏛 IEEE ⚖ 592 KB

[IEEE ICMTS 2005. 2005 International Con

[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - Simple modeling expressions for substrate network of on-chip inductors

✍ Lai, I.C.H.; Fujishima, M. 📂 Article 📅 2005 🏛 IEEE ⚖ 886 KB

[IEEE ICMTS 2005. 2005 International Con

[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - A failure analysis test structure for deep sub-micron CMOS copper interconnect technologies

✍ Cabrini, A.; Cantarelli, D.; Cappelletti, P.; Casiraghi, R.; Iezzi, D.; Maurelli 📂 Article 📅 2005 🏛 IEEE ⚖ 869 KB