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[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - 90nm CMOS technology characterization at transfer and ramp

✍ Scribed by Kelleher, A.; Gourley, D.; Holmes, A.M.; Hepburn, T.; Farrell, C.; Groves, R.; Taskin, T.; McMillan, J.; Rawlins, W.

Book ID: 126662922
Publisher: IEEE
Year: 2005
Weight: 592 KB
Category: Article
ISBN-13: 9780780388550
DOI: 10.1109/ICMTS.2005.1452208

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