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[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - Substrate isolation in 0.18um CMOS technology

✍ Scribed by Rezvani, G.A.; Jon Tao,

Book ID: 121218242
Publisher: IEEE
Year: 2005
Weight: 927 KB
Category: Article
ISBN-13: 9780780388550
DOI: 10.1109/ICMTS.2005.1452244

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