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[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - A self heating test structure using poly resistors and P/sup +//N diodes to characterize anomalous charge transfers in embedded flash memories

✍ Scribed by Mora, P.; Waltz, P.; Renard, S.; Candelier, P.

Book ID: 126725484
Publisher: IEEE
Year: 2005
Weight: 626 KB
Category: Article
ISBN-13: 9780780388550
DOI: 10.1109/ICMTS.2005.1452219

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