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[IEEE Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - Kyoto, Japan (June 14-16, 2005)] Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - Scaled 1T-bulk devices built with CMOS 90nm technology for low-cost edram applications

✍ Scribed by Ranica, R.; Villaret, A.; Malinge, P.; Gasiot, G.; Mazoyer, P.; Roche, P.; Candelier, P.; Jacquet, F.; Masson, P.; Bouchakour, R.; Fournel, R.; Schoellkopf, J.P.; Skotnicki, T.

Book ID: 121862413
Publisher: IEEE
Year: 2005
Tongue: Japanese
Weight: 756 KB
Category: Article
ISBN-13: 9784900784000
DOI: 10.1109/.2005.1469203

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