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[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - Design of a fast, easily testable ALU

✍ Scribed by Blanton, R.D.; Hayes, J.P.

Book ID: 126277263
Publisher: IEEE Comput. Soc. Press
Year: 1996
Weight: 829 KB
Category: Article
ISBN-13: 9780818673047
DOI: 10.1109/VTEST.1996.510829

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