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[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - Design and performance of CMOS TSPC cells for high speed pseudo random testing

✍ Scribed by Soufi, M.; Rochon, S.; Savaria, Y.; Kaminska, B.

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