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[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - March LR: a test for realistic linked faults

✍ Scribed by van de Goor, A.J.; Gaydadjiev, G.N.; Mikitjuk, V.G.; Yarmolik, V.N.

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