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[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems

✍ Scribed by Sogomonyan, E.S.; Gossel, M.

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