✦ LIBER ✦

[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - Improvement of SRAM-based failure analysis using calibrated Iddq testing

✍ Scribed by Balachandran, H.; Walker, D.M.H.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc. Press 14th VLSI Test

✍ van de Goor, A.J.; Gaydadjiev, G.N.; Mikitjuk, V.G.; Yarmolik, V.N. 📂 Article 📅 1996 🏛 IEEE Comput. Soc. Press ⚖ 828 KB

[IEEE Comput. Soc. Press 14th VLSI Test

✍ Blanton, R.D.; Hayes, J.P. 📂 Article 📅 1996 🏛 IEEE Comput. Soc. Press ⚖ 829 KB

[IEEE Comput. Soc. Press 14th VLSI Test

✍ Gorshe, S.S.; Bose, B. 📂 Article 📅 1996 🏛 IEEE Comput. Soc. Press ⚖ 404 KB

[IEEE Comput. Soc. Press 14th VLSI Test

✍ Arabi, K.; Kaminska, B. 📂 Article 📅 1996 🏛 IEEE Comput. Soc. Press ⚖ 707 KB

[IEEE Comput. Soc. Press 14th VLSI Test

✍ Sogomonyan, E.S.; Gossel, M. 📂 Article 📅 1996 🏛 IEEE Comput. Soc. Press ⚖ 380 KB

[IEEE Comput. Soc. Press 14th VLSI Test

✍ Soufi, M.; Rochon, S.; Savaria, Y.; Kaminska, B. 📂 Article 📅 1996 🏛 IEEE Comput. Soc. Press ⚖ 607 KB