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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - A software-based concurrent error detection technique for power PC processor-based embedded systems

✍ Scribed by Fazeli, M.; Farivar, R.; Miremadi, S.G.

Book ID: 127033242
Publisher: IEEE Comput. Soc
Year: 2005
Weight: 240 KB
Category: Article
ISBN-13: 9780769524641
DOI: 10.1109/dftvs.2005.14

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