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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Defect characterization and tolerance of QCA sequential devices and circuits

✍ Scribed by Momenzadeh, M.; Huang, J.; Lombardi, F.

Book ID: 120926321
Publisher: IEEE Comput. Soc
Year: 2005
Weight: 324 KB
Category: Article
ISBN-13: 9780769524641
DOI: 10.1109/DFTVS.2005.26

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