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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - QCA-based majority gate design under radius of effect-induced faults

✍ Scribed by Patitz, Z.D.; Park, N.; Minsu Choi, ; Meyer, F.J.

Book ID: 121734744
Publisher: IEEE Comput. Soc
Year: 2005
Weight: 497 KB
Category: Article
ISBN-13: 9780769524641
DOI: 10.1109/DFTVS.2005.55

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