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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - On generating pseudo-functional delay fault tests for scan designs

✍ Scribed by Zhuo Zhang, ; Reddy, S.M.; Pomeranz, I.

Book ID: 125536516
Publisher: IEEE Comput. Soc
Year: 2005
Weight: 218 KB
Category: Article
ISBN-13: 9780769524641
DOI: 10.1109/DFTVS.2005.49

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