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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Software-based self-test for pipelined processors: a case study

โœ Scribed by Hatzimihail, M.; Xenoulis, G.; Psarakis, M.; Gizopoulos, D.; Paschalis, A.


Book ID
121237676
Publisher
IEEE Comput. Soc
Year
2005
Weight
356 KB
Category
Article
ISBN-13
9780769524641

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