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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - A high frequency, low jitter auto-calibration phase-locked loop with built-in-self-test

✍ Scribed by Ali, S.; Briggs, G.; Margala, M.

Book ID: 121296126
Publisher: IEEE Comput. Soc
Year: 2005
Weight: 302 KB
Category: Article
ISBN-13: 9780769524641
DOI: 10.1109/DFTVS.2005.8

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