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[IEEE Comput. Soc 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (3-5 Nov. 2003)] Proceedings. 16th IEEE Symposium on Computer Arithmetic - Array codes correcting a cluster of unidirectional errors for two-dimensional matrix symbols [identification technology]

✍ Scribed by Kaneko, H.; Fujiwara, E.

Book ID: 126717778
Publisher: IEEE Comput. Soc
Year: 2003
Weight: 482 KB
Category: Article
ISBN-13: 9780769520421
DOI: 10.1109/DFTVS.2003.1250118

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